Balancing Test Coverage vs. Overhead | Interrupt

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This article is written by an external contributor, Erik Fogg of ProdPerfect, along with Tyler Hoffman representing the firmware side of the story. Enjoy!

This is a companion discussion topic for the original entry at https://interrupt.memfault.com/blog/testing-vs-overhead
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Interesting article and well written.

is there a video you would recommend for starting with unit testing C? I find that doing unit testing in embedded is hard if the code/decisions depend on the HW the code is running on.

Regards, CG.

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@shebu18 - Not a video, but this book is surprisingly easy to read and is probably the best resource on the topic: Test Driven Development for Embedded C (Pragmatic Programmers): Grenning, James W.: 9781934356623: Amazon.com: Books.

The book goes into great detail about how to test in the presence of HW dependencies using mocks and fakes.